HP 4275A MANUAL PDF

This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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An initial function test is automatically performed before measurement begins. Test Fixture, tweezer type, 3 terminal.

The Self Test is a panel pushbutton function for elementary operator checks. If a forward current flows through P-N junction when 4275w signal is at its peak voltage, a correct measurement result will not be obtained.

4275A LCR METER

Fasten it on the rear panel with the two screws 427a Test Procedure Connect a shorting strap to test fixture. Each microfiche contains up to 60 photo-dupl icates of the manual pages. General Component Measurements ‘sheet 2 of 3. When requesting copies quote the manual identification information from your supplement, or the model number and print date from the title page of the manual.

A LCR METER [Obsolete] | Keysight (formerly Agilent’s Electronic Measurement)

General Component Measurements sheet 1 of 3. J Measuring circuit has an open- circuit or a short-circuit in the test lead or test fixture being used. Front and rear panel features for the A are described in Figures and The A has self-diagnostic functions which are automatically performed or can be done any time desired to confirm the normal operation of the instrument.

The incremental errors calculated from the equations in the table for measurements at fre- quencies above IMHz are additive.

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Index of /~kurt/manuals/manuals/HP Agilent

The three numeral combinations in the tables indicate the numbers of digits displayed in the respective range and test fre- quency areas. Display A and Display B functions.

The presence of Lo and Co causes meas- urement errors, as the phase of the test 4275z nal current varies over a broad frequency re- gion around the resonant frequencies.

NOTE Manual change supplements are revised as often as necessary to keep manuals as current and accurate as possible. Display A and Display B Data. Inductance and resistance offset ad- justments are automatically performed.

Option Installation 3- 0. Measured L, C, R or jZ! This pushbutton performs automatic check for diagnosing func- tional operations of the instrument. As the characteristic impedance of the test calbe is also a factor in the pro- pagation loss and phase shift and of result- ant measuremet errorusing different type test cables must be avoided. When it is desired to test a com- ponent for its specified performance, the A can take measurements under normal op- erating test conditions.

42755a example, the wavelength of a lOMHz test signal is 30 meters which is 30 times as long as h Im standard test cables. Measured L, C, R or jz value is too low compared to the selected range. One of the convenient functions which facilitate ease of operation is the mabual initial control settings performed after the instrument is turned on.

Coifnnabit 7: Use the 0 zero position for direct attachment msnual test fixtures and the Im posi- tion for standard test leads. Remote Program Codes sheet 2 of 2. The combination of these two parameter values is the vector impedance expression for the sample. Other Options For semiconductor measurements, the special care needed for making reli- able measurement is described in Figure For these measurement applications, the use of dc bias expands the variety of test parameter settings and affords a wider scope of measurement data.

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Number of significant digits displayed for ESR and G depend on test signal level, range and frequency 5 digits max. On the other hand, a low test signal is suitable for the measurement of low signal level operating devices and of non-linear impedance elements, especially semiconductor devices.

With Ootion orinternal dc bias voltage can be applied to capac- itor sample values up to uF.

Full text of “HP: A Operating”

The inductance Lx resonates with the distributed capacitance Co at frequency fo. To compose a measurement circuit loop in a four terminal pair con- figuration, the Hcur and HpotLpot and Lcur terminals must be respectively connected together and, in addition, the shields of all conductors must be connected together as shown in Figure Safety Considerations Note that the dissipation factor is the same in both equivalent cir- cuit representations. Test signal level mo nitor: Test Signal Phase on Test Cables Figure shows the instrument and supplied accessories.

The value of the residual parameter pre- sent in measuring circuit exceeds offset control range nanual. Recall Reference Data 3 – 44275a At the resonant frequency maunal, this component is purely resistive. This figure appears when Memory Back- up Option is installed. Almost all discrete circuit components inductors, capacitors or resistors except for components having special shapes or di- mensions can be measured with this setup.

Installed option contents are dis- played as shown below: Variable Test Parameter Measurement sheet 1 of 2 Model 5A Section III Figure In the initial permeability region near the origin of the coordinate axesmanul magnetization increases gently; thus an inductor operating in this region has a low inductance value.

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